High-resolution elecron microscope observations of the width and surface roughness of left brace 100 right brace ferroelectric domain walls are reported for orthorhombic potassium niobate. Both charged/coherent and uncharged/incoherent segments were identified along a single wall, with associated apparent changes in wall thickness.
Bursill L. A.;Peng Ju Lin;Feng Duan
Philosophical Magazine A Physics of Condensed Matter Structure Defects and Mechanical Properties
1983
The birefringence topography of a Bi
Xu Xiu-Ying;Feng Duan
Journal of Materials Science
1985
It is found with TEM that there is a new phase, called M phase, coexisting with the normal P and Q phases at room temperature. All kinds of ferroelectric domains in the Q phase and antiferroelectric domains in the P phase are observed. They are in good agreement with the results given by the symmetry theory on domains and domain wall orientations in the ordered phase. Translation domain walls (TDWs) are also observed in the P phase as well as in the Q phase. The translation vector was determined as [100]
Chen Jun;Feng Duan
Physica Status Solidi A
1988
It is found from TEM observations in NaNbO
Chen Jun;Feng Duan
Physica Status Solidi A
1988
KNbW
Tao Ye;Hu Mei\u2010Shen;Feng Duan
Physica Status Solidi A
1988
By means of cross-section transmission electron microscopy, the microstructures and defects in P + implanted Si crystals are investigated. P + implantation with energy of 150 kev and dose of about 1×10 15 cm -2 was done at room temperature. It is found that there exist an amorphous layer 110 nm below the incident surface of specimen with thickness of about 100 nm, and two imperfect layers which are full of defects located symmetrically on each side of the amorphous layer. {111} stacking faults and stacking fault tetrahedra are found near the amorphous layer, and {311} defects are away from the layer. The interface between the amorphous and the imperfect layers are rough. Some other microdefects are found to be randomly distributed in these two layers. But the crystalline substrate still remains perfect.
Yan Yong;Li Qi;Feng Duan;Sun Huiling;Wang Peida
Pan Tao Ti Hsueh Pao Chinese Journal of Semiconductors
1989
The crystallographic shear planes and stacking faults with orientations parallel to the {100} and {111} pseudocubic lattice planes are observed in perovskite crystals by means of TEM. The translation vector is determined as 〈110〉/2 for the crystallographic planes, while the stacking disorder is just the planar faults at which the stacking order of the corner‐connected octahedra in the {111} plane are misarranged to form the so‐called face‐sheared octahedra. The existence of such two kinds of planar defects indicates that the transition or alkali metal atoms can easily migrate due to the large concentrations of oxygen vacancies in the perovskite at sufficiently high temperature. Copyright © 1989 WILEY‐VCH Verlag GmbH & Co. KGaA
Chen Jun;Feng Duan
Physica Status Solidi A
1989
Variable temperature observations by cross-section transmission electron microscope and high resolution electron microscope images show that an amorphous layer is formed after an Er + (150 keV, 1 × 10 15 cm -2 ) implanting into crystalline silicon. During thermal annealing, the amorphous layer is recrystallized into polysilicon layer through solid-phase epitaxial regrowth from the amorphous-crystalline interface and through the nucleation in the amorphous layer. There are a lot of twin boundaries and stacking faults in the recrystallized grains.
Yan Yong;Wang Peida;Hu Meisheng;Sun Huiling;Li Qi;Feng Duan
Pan Tao Ti Hsueh Pao Chinese Journal of Semiconductors
1990
Amorphous semiconductors have been entering an exciting new field of 'superlattices' in recent years. This new class of semiconducting materials, with very interesting properties, can be synthesized by alternate ultrathin layers of amorphous materials. In this paper we report the realization of amorphous silicon (a-Si:H) superlattices composed either of a-Si:H/a-SiN
Chen Kunji;Du Jiafang;Li Zhifeng;Xu Jun;Jiang Jiangong;Feng Duan
Vacuum
1991
Quasiperiodic (Fibonacci sequence) Nb/Cu, Cu/Ti and Ta/Al metallic multilayers were fabricated by magnetron sputtering. The microstructures of these multilayers were investigated by means of X-ray and electron diffractions, TEM, Auger spectroscopy and light scattering. The self-similarity of the reciprocal lattice is approximately satisfied. The possible applications of the high-Z/low-Z quasiperiodic metallic multilayers as the optical elements at near normal incidence angle in the case of high photon energy in the soft X-ray region are discussed. Both theoretical and experimental studies on a new class of quasiperiodic structure are reported. © 1993.
Jiang S. S.;Hu A.;Peng R. W.;Feng D.
Journal of Magnetism and Magnetic Materials
1993