Strain relaxation and defect formation in heteroepitaxial Si1-xGex films via surface roughening induced by controlled annealing experiments
Cengiz S. Ozkan;William D. Nix;华健 高
1997-4-28 Applied Physics Letters
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被引量Suddenly arrested intersonic shear crack
永刚 黄;华健 高
2001 American Society of Mechanical Engineers, Applied Mechanics Division, AMD
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被引量